PHD Position Digital Holography

PhD Position Digital Holography for Metrology (Delft, NL, 2628 CD) Delft University of Technology (TU Delft)
Posted on Sep 9, 2026
Do you make the metrology tools of the future?
Job description
As semiconductor feature sizes are going down, device complexity is going up, and high yield is critical there is an urgent need for new and improved metrology solutions to meet these challenges. Digital holography (DH) is a technology that can provide single shot full wavefield imaging of flat single layered structures. However, its utility to more complex-shaped multi-layered structures is limited.
In this project you will design and construct advanced DH systems to visualize complex optical samples comprising of multiple layers, rough surfaces, curved surfaces, and/or defects. You will utilize multi-angle and/or multi-wavelength DH measurements, borrowing from knowledge in optical (coherence) tomography, and convert them to accurate sample reconstructions using advanced signal processing and tomographic reconstruction algorithms. With the inclusion of noise the object estimation accuracy will be based on statistical concepts and prior knowledge of the sample geometry. You investigate and optimize the trade-off between accuracy and imaging speed. For real-time application, the speed and accuracy of the algorithms will be improved using machine learning techniques. The developed techniques will be applied to metrology of semiconductor samples.
Job requirements
You are an enthusiastic candidates with a 'drive' for applied physics and building high performance imaging systems. She or he has a demonstrable interest in optics, signal processing, and mathematics or machine learning. The candidate should have an MSc degree in Applied Physics, Electrical Engineering, or the equivalent. The PhD position is firmly imbedded in a physics environment, but the candidate strongly interacts with partners in applied physics, applied mathematics, and ...